Real Time Data Collection Circuit for Pre-Burn-In Screener
Original Publication Date: 1987-Dec-01
Included in the Prior Art Database: 2005-Feb-02
This article describes a real time data collection circuit that provides an interface between a pre-burn-in screener and a personal computer. The use of this circuit will allow the identification of passing or failing chips in a deck in a fast and efficient manner. Referring to the block diagram, during the data collection mode of operation, the circuit 10 is configured to collect pass/fail data from the screener 12 into RAM 14. RAM 14 is addressed by address counter 16 and address multiplexer 18. When a test is completed, the read multiplexer 20 is switched to receive data from RAM 14. Pass/fail data is routed to a personal computer 22 in which the data is processed to display individual chips passing or failing on a given deck.