Time-of-Flight Electron-Beam Pulse Compression
Original Publication Date: 1987-Mar-01
Included in the Prior Art Database: 2005-Feb-02
In stroboscopic E-beam testing, it is desirable to use very short pulses of electrons, as short as 10 ps, while running at a 1 ns repetition rate. Present E-beam testers can achieve this by discarding the beam during the unused time but this means a large fraction of the already low intensity beam is wasted.