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Time-of-Flight Electron-Beam Pulse Compression

IP.com Disclosure Number: IPCOM000040915D
Original Publication Date: 1987-Mar-01
Included in the Prior Art Database: 2005-Feb-02

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Jenkins, KA [+details]


In stroboscopic E-beam testing, it is desirable to use very short pulses of electrons, as short as 10 ps, while running at a 1 ns repetition rate. Present E-beam testers can achieve this by discarding the beam during the unused time but this means a large fraction of the already low intensity beam is wasted.