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A technique is described for accurately positioning substrates in a test environment so that electrical tests can be performed at all points on the substrate.
English (United States)
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Alignment of Substrates for Testing
A technique is described for accurately positioning substrates in a test
environment so that electrical tests can be performed at all points on the
In the manufacture of substrates, all of the points on a substrate must be
tested at the same time. This entails bringing a test probe having wire probes
into contact with each of the points. Due to the small dimensions and physical
tolerances of the wire probes and the points on the substrates, the alignment of
the probes with the points can be difficult and tedious.
It is known that the largest variations in positioning of the points on the
substrates occur at those points which are located at the outer edges of the
substrate. A prism or beam splitter can be used to create an image on a video
monitor of the points located at the four corners of a substrate. Initially, a
permanent target image is created on the monitor corresponding to the four
corner wires of the test probe using the same monitor and the beam splitter. An
operator can then readily and accurately locate a substrate to be tested by
aligning the image of the four corner points of the substrate with the permanent
image of the corners of the test probe on the monitor for each substrate. Minor
positional changes of the substrate with respect to the permanent target image
can be readily made in the x, y or rotational directions.