Browse Prior Art Database

Alignment of Substrates for Testing

IP.com Disclosure Number: IPCOM000041009D
Original Publication Date: 1987-May-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
Beaumont, GD [+details]

Abstract

A technique is described for accurately positioning substrates in a test environment so that electrical tests can be performed at all points on the substrate.