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Browse Prior Art Database

Universal Nodal Test Fixture for Electronic Card Assemblies

IP.com Disclosure Number: IPCOM000041093D
Original Publication Date: 1987-Jul-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
Deeg, WE [+details]

Abstract

A test fixture for testing electronic circuit card assemblies is provided with means to accommodate engineering changes without having to make expensive modifications to the test fixture. The means by which this is accomplished is to pre-drill the fixture to the maximum possible circuit hole pattern which the electronic card assembly could ever utilize. Tester probe pins are either added or deleted depending upon the particular hole pattern used in the design of the card assembly.