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Word Redundancy Test Software And Strategy

IP.com Disclosure Number: IPCOM000041184D
Original Publication Date: 1987-Nov-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
Masson, JJ [+details]

Abstract

A method has been proposed to significantly reduce the time required to test array products in semiconductor manufacturing processes. The proposal suggests having the tester register the fail cells in the main array and by means of a tailored software the fail in the main array is repaired by use of a redundant array.