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Stress Measurement Wafer Holder

IP.com Disclosure Number: IPCOM000041349D
Original Publication Date: 1984-Jan-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
deHodgins, OC [+details]

Abstract

Complete photo-elastic analysis can be carried out using only the plane or circular polariscope, which is in fact the basic apparatus of photo-elasticity. The specimen under this kind of analysis should be mounted on a straining frame constructed in such a way as to enable any part of the model to be brought into the light beam from the polarizer. The specimen should be properly fixed into the frame by holders that will not impose stresses during loading. The frame shown here includes special clamps for wafers. Specific variations may be necessary to suit the requirements of a particular investigation. The holder shown here runs non-destructive tensile and compressive tests.