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Card-Testing Error-Handling Process Disclosure Number: IPCOM000041456D
Original Publication Date: 1984-Jan-01
Included in the Prior Art Database: 2005-Feb-02

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Decker, LW Echelmeier, RH [+details]


Test results for individual components or subassemblies are stored and interpreted as a function of the overall circuit operation associated with those components. Depending upon overall functional test results, a decision is rendered as to handling of compiled error data corresponding to each monitored element. The stored error data is useful to indicate which components require replacement but, in the case of an acceptably overall operating unit, it is possible to elect to ignore the stored error data. In-circuit card testing employs various structures for establishing electrical connections with components in place on the cards. Several factors can cause test readings on the components to indicate that the components are not acceptable when, in fact, the components are acceptable.