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Automatic Testing of Parallel Lines

IP.com Disclosure Number: IPCOM000041490D
Original Publication Date: 1984-Feb-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
Nahata, P [+details]

Abstract

The preceding article describes a method for short and open testing of parallel lines. Conditions may exist under which short-testing of parallel lines will produce erroneous results. In this article it is proposed that, for short-testing, voltage be applied to one end of a line while grounding the other line and sensing the voltage. If a short between the lines exists, then the voltage will fall below a certain minimum level. 1. A break in one of the lines under test also needs to be considered. This can be handled by modifying the switching network and also by making the short-testing a two-step procedure rather than a single-step. 2. Depending on the locations of opens it may not be possible to get proper results for shorts and replacement may be necessary prior to further testing.