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Pass-Transistor-Circuit-Failure Analysis

IP.com Disclosure Number: IPCOM000041530D
Original Publication Date: 1984-Feb-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
Roth, JP Tsai, MY Woo, LW [+details]

Abstract

Pass transistors are a common form of transistor for very large-scale integration (VLSI). Their functional behavior is substantially different from that of bipolar technologies, and the question of their diagnosis requires a new analysis. First, there is an analysis of the behavior without failure of primitive transistor configurations, which are sufficient to cover any pass-transistor design. Next, the D-algorithm is adapted 1 Ùto compute tests, when they exist, for failures. For this purpose, tests of length 2 are derived for some failures, which could not be tested in one wave. Pass transistors are special field-effect transistors, widely planned for use in VLSI. Their behavior differs substantially from those represented by "logic gates"; for example, the bare transistor has a kind of memory.