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Testing the Adhesion of Thin Layers on Substrates

IP.com Disclosure Number: IPCOM000041929D
Original Publication Date: 1984-Mar-01
Included in the Prior Art Database: 2005-Feb-03

Publishing Venue

IBM

Related People

Authors:
Meyer, DW Roemer, HR [+details]

Abstract

The well-known Vicker's hardness test is modified to allow the adhesion of thin, transparent, non-ductile layers on substrates to be rapidly classified and used as feedback during their production. Modification of the Vicker's test is achieved by increasing the diamond force beyond the forces generally applied to a value at which the shearing forces between layer and substrate cause a variety of effects, such as diamond imprints, cracks at the diamond corners, and a circular layer separation recognizable as interference fringes.