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Input/Output Connector Fixture for Testing Cards

IP.com Disclosure Number: IPCOM000041963D
Original Publication Date: 1984-Mar-01
Included in the Prior Art Database: 2005-Feb-03

Publishing Venue

IBM

Related People

Authors:
Nelson, DQ [+details]

Abstract

In card testing several needs exist. Positive contact is required during incircuit and functional testing. A need exists to test the edge connector on standard cards. There is also a need for two-stage fixturing for functional testing to eliminate capacitive test points. Finally, it would be advantageous to reduce the number of nail test points for vacuum fixturing. A fixture is illustrated in the figure that will meet the above needs. The card-under-test (CUT) sits under a transparent plastic cover which is attached to two actuator levers. This cover serves as a protection to the test operator from destructive components (i.e., electrolytic capacitors). The phenolic probe block provides the isolation necessary for the probe pins. Phenolic is easily worked by a tool maker. All other parts are aluminum.