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Thin Film Light Enhancement

IP.com Disclosure Number: IPCOM000042489D
Original Publication Date: 1984-May-01
Included in the Prior Art Database: 2005-Feb-03

Publishing Venue

IBM

Related People

Authors:
Puterbaugh, LJ Rivenburgh, DL Turner, JF [+details]

Abstract

Light is projected along the three orthogonal axes of a substrate bearing a translucent thin organic film to enhance visibility of the film for measuring purposes using optical microscopy. It is particularly useful for measuring thin polyimide layers in the micron range which are spray coated on circuitized ceramic substrates. A sectioned sample S (Fig. 1) of the circuitized ceramic substrate 1 (Fig. 2) is encapsulated in a transparent cylindrically shaped epoxy member E. Sample S has an organic film 6, and the bottom edge 2 of sample S is oriented normal to the optical axis Z of a high power, e.g., 1000x, photographic measuring microscope (not shown). Coincident with axis Z is the light from a high intensity, e.g.