Browse Prior Art Database

Transparent Stop Alignment Jig

IP.com Disclosure Number: IPCOM000042756D
Original Publication Date: 1984-Jun-01
Included in the Prior Art Database: 2005-Feb-04

Publishing Venue

IBM

Related People

Authors:
Ferris, KK Templin, LE [+details]

Abstract

Fig. 1 shows a side view of the existing ceramic substrate test assembly generally known as the deck test assembly. The test head 1 has many test probes 2 arranged in a generally square array so as to be aligned with the heads 4 of the pins 4' in the ceramic substrate 3 which is to be tested. In operation, the test assembly sequentially indexes ceramic substrates 3 so that the forwardmost substrate is stopped by the surface 6 of the test head stop 5. As seen in Fig. 2 in a top view, the stop 5 is projected into the path of motion for the substrate 3, thereby stopping the substrate 3 in the desired aligned position with the test probes 2 of the test head 1.