Browse Prior Art Database

IBM Series/1 Computer-Driven Parametric Tester System

IP.com Disclosure Number: IPCOM000043062D
Original Publication Date: 1984-Jul-01
Included in the Prior Art Database: 2005-Feb-04

Publishing Venue

IBM

Related People

Authors:
Brody, J Wilkinson, T [+details]

Abstract

An IBM Series/1 is connected to a Kiethley System 1 DC Parametric Tester*, via a Kiethley Model 790 controller*, to permit high speed DC parametric testing with increased flexibility. Referring to the figure, an IBM Series/1 1 is connected to a Kiethley Model 790 controller 2 via an IEEE-488 Bus system 3. The Series/1 acts as a controller for Kiethley System 1 tester 4. Special software in the Series 1 permits the user to correlate tester channels with the appropriate pins on the chip, substrate or module to be tested. The software also permits the user to define the appropriate test and assign the test to the appropriate tester channel. The user may manually step through the defined tests or execute the tests at full speed. Diagnostic software is also included to check controller 2 and tester 4.