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Use of Design-Of-Experiments to Establish Component Tolerances for a Phase-Locked Loop Pull-In Range

IP.com Disclosure Number: IPCOM000043796D
Original Publication Date: 1984-Sep-01
Included in the Prior Art Database: 2005-Feb-05

Publishing Venue

IBM

Related People

Authors:
Talkington, CM [+details]

Abstract

Determining an analytical relationship among the variables in a phase-locked loop type of circuit -- essential for establishing tolerances of key components -- has been difficult because of the complexity involved, and conventional modeling approaches have been inadequate. This invention entails usage of a design-of-experiments model employing linear regression techniques to enable the necessary analysis of circuit performance and the determination of tolerance levels. A phase-locked loop, illustrated in Fig. 1, is a complex type of circuit used in a large-screen word-processor display to generate the horizontal pulses which drive the horizontal sweep synchronized with the horizontal sweep input frequency. In the example studied, the input sync frequency is 50.