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Transient Mode Soft Fail Emitter-Coupled Logic Bipolar Static Cell Test Site

IP.com Disclosure Number: IPCOM000044128D
Original Publication Date: 1984-Nov-01
Included in the Prior Art Database: 2005-Feb-05

Publishing Venue

IBM

Related People

Authors:
Voldman, SH [+details]

Abstract

When an alpha particle tracks through a bipolar static cell, a soft error can occur if the charge storage at a given time is less than the charge collected. The carriers generated in the depletion region or in the funnel created by the alpha particle are collected in a subnanosecond time scale. Carriers generated in the quasi-neutral regions diffuse to the junction in a nanosecond time scale. An emitter-coupled logic (ECL) resistive loaded bipolar static cell (Fig. 1) can be used as a tool to determine what percentage of the charge collection is due to a drift-funnel collection versus diffusion collection by designing the cell to be insensitive in the standby mode and sensitive in a transient mode of operation.