IBM Series/1 Channel Simulator
Original Publication Date: 1984-Nov-01
Included in the Prior Art Database: 2005-Feb-05
Signature analysis techniques for use in testing and troubleshooting electronic circuits have limitations where feedback situations are present. This article describes a technique for testing circuits in channel attachment cards by simulating the channel and utilizing the microprocessor on the card-under-test (c-u-t) to exercise the I/O portion of the c-u-t via the simulator. In that manner, the "handshaking" feedback protocols of the channel are simulated and problems of synchronizing the IBM Series/1 test equipment processor with the microprocessor on the c-u-t is eliminated. The circuit shown in the figure avoids the problems of testing a Series/1 channel attachment card by providing a channel simulator which is controlled by the card-under-test.