Dismiss
The InnovationQ application will be updated on Sunday, May 31st from 10am-noon ET. You may experience brief service interruptions during that time.
Browse Prior Art Database

Module Testing

IP.com Disclosure Number: IPCOM000044340D
Original Publication Date: 1984-Dec-01
Included in the Prior Art Database: 2005-Feb-05

Publishing Venue

IBM

Related People

Authors:
Bond, AL [+details]

Abstract

This article provides a technique for testing microprocessors with built-in test routines. An input control line called Diagnostic Enable/Disable Request and an output control line called Self-Check Complete are manipulated and, as a result, the processor is forced to perform the sequence of tests in its repertoire. As a result, the microprocessor is tested at operational speed as opposed to the use of tester generated input frequencies using a generic pattern set at non- operational speed. Referring to the figure, the two control lines allow a card tester (not shown) to evaluate the operational status of the microprocessor unit containing a processor, ROS (read-only storage), RAM (random- access memory) and I/O support circuitry.