Browse Prior Art Database

DIODE TEST Method

IP.com Disclosure Number: IPCOM000044566D
Original Publication Date: 1984-Dec-01
Included in the Prior Art Database: 2005-Feb-06

Publishing Venue

IBM

Related People

Authors:
Shaw, DE [+details]

Abstract

The circuit shown in Fig. 1 illustrates a convenient GO/NO GO electrical test for discrete diodes. Fig. 2 illustrates the basic circuit expanded into the same test for diode bridge assemblies. Points A and B (Fig. 1) and A, B, C and D (Fig. 2) represent an appropriate test clip connection. The circuit will sort out diodes that: (a) are SHORTED, (b) are OPEN, and (c) have HIGH FORWARD RESISTANCE. Referring to Fig. 1, with 6 volts AC applied across points A and B (through the resistor), the following conditions prevail, assuming the device under test (DUT) is a functionally GOOD diode; POSITIVE HALF CYCLE (point A is positive with respect to B) The DUT will conduct, thus holding the voltage Vt within the approximate range of 0.5