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Vertical Partition Test Patterns

IP.com Disclosure Number: IPCOM000044961D
Original Publication Date: 1983-Jan-01
Included in the Prior Art Database: 2005-Feb-06

Publishing Venue

IBM

Related People

Authors:
Tsui, F [+details]

Abstract

Vertical partition of the logic of large-scale integration devices, with multiplexer connection of overlap groups to common logic, reduces the complexity of test procedures and reduces the test logical requirement.