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Logic Design Simulator using APL Disclosure Number: IPCOM000045060D
Original Publication Date: 1983-Jan-01
Included in the Prior Art Database: 2005-Feb-06

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Slishman, GR [+details]


The characteristic component of a Level Sensitive Scan Design (LSSD) is the Shift Register Latch (SRL), consisting of two D-latches, L1 and L2. Non-overlapping clocks, denoted C and B, control the L1 and L2, respectively. Since an L1 latch is never a function of L1s, and an L2 latch is never a function of L2s, adequate clock separation precludes signal races.