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Method for Sampling Test Points in Logic Circuits

IP.com Disclosure Number: IPCOM000045117D
Original Publication Date: 1983-Feb-01
Included in the Prior Art Database: 2005-Feb-06

Publishing Venue

IBM

Related People

Authors:
McAnney, WH [+details]

Abstract

The diagnosability of logic circuits can be improved by converting some internal lines into externally observable test points.