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Fault Tolerant Serial Shift Arrangement

IP.com Disclosure Number: IPCOM000045152D
Original Publication Date: 1983-Feb-01
Included in the Prior Art Database: 2005-Feb-06

Publishing Venue

IBM

Related People

Authors:
Tsui, F [+details]

Abstract

A fault tolerant serial shift arrangement is described, which enhances the probability of a serial shift arrangement remaining usable even in the presence of faults. Redundancies are incorporated in the serial shift arrangement, so that latches will be joined to form bidirectional shiftable chains, and that such a change will be subdivided in segments to be joined by gated connections in order to provide switchable alternative configurations. The bidirectional shiftability renders a shiftable chain testable and diagnosable for faults, while the configurability increases the probability of a serial shift arrangement being usable after faults are detected and located.