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Automated Crack Test Machine

IP.com Disclosure Number: IPCOM000045798D
Original Publication Date: 1983-Apr-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Darekar, VS [+details]

Abstract

An automated technique for subjecting circuit card samples to temperature shock provides more reliable and consistent test results than hand operations.