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Subsummation referes to the process of combining test patterns to reduce the total pattern count sent to manufacturing.
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Subsummation referes to the process of combining test patterns to reduce
the total pattern count sent to manufacturing.
A dynamic subsummation technique can be used as an integral part of test
generation. This has advantages over the post-subsummation of other
Test vectors are combined before the sequencing through latches and arrays
has been added. As each combinational test vector (treating latches and arrays
as inputs) is generated, it is merged into the earliest possible test vector already
in the test buffer (the buffer capacity is 255 vectors). Two test vectors can be
merged if corresponding inputs are not conflicting (same value or unassigned).
Because subsummation is done before sequencing, the subsume algorithm does
not need to consider any sequential dependency between patterns as is the case
with post-processing. This results in a more efficient (less time) as well as more
effective (fewer patterns) process.