Browse Prior Art Database

Electrical Overload Protection in LSI Device Readout

IP.com Disclosure Number: IPCOM000045885D
Original Publication Date: 1983-Apr-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Yu, CC [+details]

Abstract

Electrical overload (EOL)-induced failure may occur during LSI device readout using automatic testers. Sometimes, failures of this type are indistinguishable from those induced by life test, and consequently important reliability information is lost. EOL-induced failures can be minimized by inserting on-chip devices that are not susceptible to EOL failure between the input signals and the devices under test.