Electrical Overload Protection in LSI Device Readout
Original Publication Date: 1983-Apr-01
Included in the Prior Art Database: 2005-Feb-07
Electrical overload (EOL)-induced failure may occur during LSI device readout using automatic testers. Sometimes, failures of this type are indistinguishable from those induced by life test, and consequently important reliability information is lost. EOL-induced failures can be minimized by inserting on-chip devices that are not susceptible to EOL failure between the input signals and the devices under test.