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Testing Tester Relays Within a Tester

IP.com Disclosure Number: IPCOM000046082D
Original Publication Date: 1983-May-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Burke, RD Reichert, PC [+details]

Abstract

Conventional integrated circuit testers are adapted to test devices having 50 or more contact pins. Typically, such testers include an equivalent number of pin cards, each pin card being capable of forcing a predetermined quantity of current along the force line to a pin on the device under test and sensing the resultant voltage at the pin of the device under test.