Browse Prior Art Database

Semiconductor Device Yield Model for Extended Yields

IP.com Disclosure Number: IPCOM000046179D
Original Publication Date: 1983-Jun-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Stapper, CH [+details]

Abstract

This article describes an easily implemented yield model for calculating partially good and redundancy yields of large memory chips which is suitable for manufacturing control.