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Fault-Tolerant Memory Chip Architecture for Yield Enhancement and Field Repair Disclosure Number: IPCOM000046264D
Original Publication Date: 1983-Jun-01
Included in the Prior Art Database: 2005-Feb-07

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Related People

Singh, S Singh, VP [+details]


This chip has one bit line and/or one word line inplace-spare along with appropriate logic to allow substitution for faults at manufacture for yield enhancement or any other time for field repairs.