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Chip Test Adapter Lifetime Extension Technique

IP.com Disclosure Number: IPCOM000046322D
Original Publication Date: 1983-Jul-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Herrell, DJ [+details]

Abstract

Providing a staggered array of chip test sites on a chip test adapter, and shifting the alignment of the chip test adapter to position for each use a new set of test sites, significantly extends the lifetime of a chip test adapter.