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Optical Method to Determine Magnetic Coating Thickness

IP.com Disclosure Number: IPCOM000046514D
Original Publication Date: 1983-Jul-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Mastrangelo, CJ [+details]

Abstract

Thickness measurements of magnetic coatings have traditionally been made using X-ray analysis. This is a well-understood and accurate method, but requires a minute or so of counting to provide sufficient data for a thickness determination. In addition, there is a current concern of the environmental hazard of X-rays. Because of the time required with X-ray analysis, it is not feasible to monitor thickness in real time, that is, while the thickness is being reduced due to buffing. If an instantaneous detection method were available, it would allow monitoring magnetic coating thickness change while it was happening.