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Functional AC Card Test Using a DC Tester

IP.com Disclosure Number: IPCOM000047165D
Original Publication Date: 1983-Oct-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Shook, FS Spoerl, RC Vogelsberg, RE Zufelt, IE [+details]

Abstract

Described is a modification that permits a low-cost DC card tester to perform functional testing on microprocessor-based logic cards. An accepted method of testing microprocessor-based logic cards is a functional AC self-test. This is usually performed on large, costly test systems having both AC and DC testing capabilities. Functional AC testing, however, can be accomplished by executing a series of card test routines by the card under test (CUT). Testing is done in an AC environment at machine speeds and as an extension of the DC testing without the need for the more expensive AC tester.