Flexible Data Collection Function for Burn-In Tools
Original Publication Date: 1983-Oct-01
Included in the Prior Art Database: 2005-Feb-07
This circuit permits data collection from any memory product regardless of product organization. The circuit also provides a realtime count and fail address limit comparison for high temperature fail criteria as well as high throughput, and can be adapted to any existing software-driven test system. The data output of a device under test (DUT) 10 is fed into sense current or voltage level detectors (not shown), the output of which is loaded into the product data output register 11 in parallel or serially depending on the architecture of the device under test. The output of register 11 is compared in a comparator 12 against the expected data which is fed to the expected data register 13 from a pattern generator 14. The compared information is loaded into a data-out register 15.