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Browse Prior Art Database

Automatic Part Thickness Measuring and Sorting System

IP.com Disclosure Number: IPCOM000047236D
Original Publication Date: 1983-Oct-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Howe, SM Schartau, GM [+details]

Abstract

The present system comprises a thickness-measuring device and a sorting device based on the measurements provided by the measuring device. The measuring device comprises two non-contact probes mounted opposite each other, between which is conveyed the part whose thickness is to be measured. Measurement is done by comparing the sum of the measurements provided by both probes to a corresponding sum obtained from a known master gauge. Referring to the figure, part 1, whose thickness is to be measured, is brought to the measuring station by a conveyor 2 and is detected by proximity detector 3 when in proper position for measurement. The signals from detector 3 are used to indicate to programmable controller 4 when to take the measurement data into account.