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Analytical Method for In-Situ Molecular Weight Determination of Perfluorinated Ethers

IP.com Disclosure Number: IPCOM000047434D
Original Publication Date: 1983-Nov-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Gutierrez, A Pacansky, J [+details]

Abstract

Perfluorinated ethers are used in many industrial processes. As a result of this a number of special analytical techniques have been devised to measure various physical and chemical properties for the materials under unique circumstances. Here, we describe a method that is capable of determining the molecular weight for a perfluorinated ether when it is present in very small quantities, e.g., as a thin film on a substrate. The method is demonstrated for a particular class of perfluorinated ethers; their structure is shown below: CF3CF2(CF(CF3)CF20)n(CF20)mCF2CF3 n>>m molecular weight N/N 8,000 Samples, whose molecular weights were known, were spin coated onto gold-plated copper substrates to achieve a thickness of about one micron.