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Method of Generating Zero Risk Analysis Data

IP.com Disclosure Number: IPCOM000047553D
Original Publication Date: 1983-Dec-01
Included in the Prior Art Database: 2005-Feb-07

Publishing Venue

IBM

Related People

Authors:
Haining, FW Hespenheide, JE Shaul, RF [+details]

Abstract

In order to Voltage Stress Test multilayer printed circuit boards, data must be generated to identify which conductors are adjacent to each other. This method provides a listing of these nets. The concept of "Zero Risk Analysis" is based on grouping nets which have no risk (Zero Risk) to each other, and applying an electrical stress (bias) between the various groups. To implement this new testing technique, a method was needed to determine which nets have risk to which other nets. The method developed uses two graphics tools, herein called the Interactive Graphics System (IGS) and the Unified Shapes Checking (USC) system.