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Testing for Several Failures

IP.com Disclosure Number: IPCOM000048094D
Original Publication Date: 1981-Dec-01
Included in the Prior Art Database: 2005-Feb-08

Publishing Venue

IBM

Related People

Authors:
Roth, JP [+details]

Abstract

In many testing applications, notably self testing, it is desirable to have as small as possible an assemblage of tests to detect a given assemblage of failures. Previous algorithms, notably the D algorithm (1), compute a test to detect just one failure. Herein is described a variation on the D algorithm which computes a test, if one exists, to detect any one of a prescribed set of failures, in an acyclic circuit or else in a cyclic circuit having level sensitive scan design (LSSD) (1). It was found expedient, in this task, to utilize a calculus of many values, a multivalued logic, as compared with the 5-valued logic used in the D algorithm. The test computed is guaranteed to detect any one of the failures assumed.