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Thorough read-only and random access memory contents verification and error detection are provided by utilizing a minimum number of comparison key bytes and two scans of memory.
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Two Pass Memory Test
Thorough read-only and random access memory contents verification and
error detection are provided by utilizing a minimum number of comparison key
bytes and two scans of memory.
In the first scan of memory, the contents of all 8-bit byte
locations are sequentially added to the lowest 8 bits in a 24-bit
accumulator. Any overflow from the highest order bit of the
accumulator is repeatedly added back to the lowest order bit.
Following the first scan, the accumulator contents are compared with
a 24-bit expected result. The expected result is comprised of three
key bytes made up of 8 bits each. If there is a non-compare, an error
is present. If there is a compare, the memory is again scanned.
During the second scan, the contents of all locations are again
sequentially added in, the accumulator with a leftward shift of the
accumulator for each add operation. The overflow of the highest-order
bit is repeatedly added back to the lowest-order bit. Upon completion
of the second scan, the accumulator contents are again compared with
an expected result comprised of additional three-key bytes. If there
is a compare, no errors are considered to exist.
With the above test routine, all odd number bit faults will be detected, and
substantially all even number bit faults will be detected.