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Production Signature Analysis Diagnosis with Relaxed Design Constraints

IP.com Disclosure Number: IPCOM000048126D
Original Publication Date: 1981-Dec-01
Included in the Prior Art Database: 2005-Feb-08

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Zobniw, LM [+details]


A self stimulating signature Analysis (SA) testing approach offers the opportunity to examine a card under test (CUT) at real time speed and with a less costly hardware tester, as compared to the sophisticated functional speed testers with high speed programmable buffers. The SA testing approach is tailored to test cards designed with functional devices, i.e., microprocessors and microprocessor related devices, that require functional speed testing. SA does not replace the need for functional speed testers especially to test asynchronous "random logic" card designs. However, for many card designs, the described production SA testing approach can be used to free the costly functional testers for cards that require them.