Use of Manufacturing Constraints to Minimize Hardware
Original Publication Date: 1981-Dec-01
Included in the Prior Art Database: 2005-Feb-08
Design in large scale integration must cope with the constraints of manufacturing. In order to enable sequential logic testing, all latches are implemented by using the LSSD (Level Sensitive Scan Device) technique. This proposal makes use of the testing latches as a piece of hardware to embody given functions.