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Screening of Dielectric Defects in Memory Devices

IP.com Disclosure Number: IPCOM000048412D
Original Publication Date: 1982-Jan-01
Included in the Prior Art Database: 2005-Feb-08

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Related People

Anolick, ES Chen, LY Malik, SK [+details]


Substantially all failures of dielectrics in memory devices are related to defects which existed during the manufacturing process. For this reason, heavy stressing of dielectrics during the manufacturing process will screen out many potential failures without affecting the structures which have no dielectric defects.