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Parallel Fail Detect Circuit

IP.com Disclosure Number: IPCOM000048416D
Original Publication Date: 1982-Jan-01
Included in the Prior Art Database: 2005-Feb-08

Publishing Venue

IBM

Related People

Authors:
Anolick, ES Camenga, R [+details]

Abstract

For dielectric studies it is necessary to continuously monitor the samples under test. An incoming voltage spike or an incoming voltage level of either polarity must cause the fail detect circuit to disconnect the device under test and present a signal to a data system.