The InnovationQ application will be updated on Sunday, May 31st from 10am-noon ET. You may experience brief service interruptions during that time.
Browse Prior Art Database

Ovation Pattern Recognition System

IP.com Disclosure Number: IPCOM000049010D
Original Publication Date: 1982-Apr-01
Included in the Prior Art Database: 2005-Feb-09

Publishing Venue


Related People

Schmidt, S [+details]


The Ovation tool scans various MLC (multilayer ceramic) greensheet layers to guarantee accurate screening of conductor designs. Since there existed no capability to verify module post processor data prior to hardware testing, a set of algorithms and corresponding computer program (Ovation Pattern Recognition - OPAR) was developed as part of the OVATION checkmate system. OPAR was set up to recognize patterns formed in the individual layers so that they could be checked against the original input design.