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Ovation Pattern Recognition System

IP.com Disclosure Number: IPCOM000049010D
Original Publication Date: 1982-Apr-01
Included in the Prior Art Database: 2005-Feb-09

Publishing Venue

IBM

Related People

Authors:
Schmidt, S [+details]

Abstract

The Ovation tool scans various MLC (multilayer ceramic) greensheet layers to guarantee accurate screening of conductor designs. Since there existed no capability to verify module post processor data prior to hardware testing, a set of algorithms and corresponding computer program (Ovation Pattern Recognition - OPAR) was developed as part of the OVATION checkmate system. OPAR was set up to recognize patterns formed in the individual layers so that they could be checked against the original input design.