VLSI Short Detection
Original Publication Date: 1982-Apr-01
Included in the Prior Art Database: 2005-Feb-09
In VLSI (very large-scale integration) shorts between wires are common forms of failure; such failures are not covered by methods for acyclic failure testing in the case that new feedback, hence new sequential behavior, is introduced. The method of Level Sensitive Scan Design (LSSD) or regular design (*) turns a sequential diagnosis problem into a combinational diagnosis problem.