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Four Point Probe Fixture

IP.com Disclosure Number: IPCOM000049303D
Original Publication Date: 1982-Apr-01
Included in the Prior Art Database: 2005-Feb-09

Publishing Venue

IBM

Related People

Authors:
Andreasen, AC Capani, PM [+details]

Abstract

This hand-held fixture allows non-destructive four-point probing of fragile additively-plated copper circuit lines on printed circuit cards and boards. Contacting the line is simplified since the fixture uses a matrix probe that allows four-point contacting to be accomplished with a two-point geometry. In using a matrix probe, the total contact surface area is increased, thereby significantly reducing the average stress under the probe and the resultant stress gradient in the surrounding copper line for a given force as compared to a standard instrumentation probe.