Improves Decoding Timing for One Device FET Random Access Memory Arrays
Original Publication Date: 1982-Apr-01
Included in the Prior Art Database: 2005-Feb-09
This is a technique for delaying column decoding in field-effect transistor (FET) random-access memory (RAM) arrays until critical sensing has been completed. In this way, substrate noise generated by column decoding is prevented from disturbing the sensing operation.