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Method of Absolutely Determining the Oxygen/ Chromium Ratio in Vapor Deposited Chromium Layers

IP.com Disclosure Number: IPCOM000049380D
Original Publication Date: 1982-Apr-01
Included in the Prior Art Database: 2005-Feb-09

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Hoffmeister, WW Schumacher, H [+details]


A method is described for absolutely determining the oxygen/chromium ratio in partially oxidized chromium layers used in contact metallurgy, which is more accurate than physical methods, such as SIMS (Secondary Ion Mass Spectroscopy) or Auger spectroscopy, where the absolute magnitudes of a number of physical measuring values are only inadequately known.