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Four Point Probe Fixture with Single Degree of Freedom

IP.com Disclosure Number: IPCOM000050086D
Original Publication Date: 1982-Sep-01
Included in the Prior Art Database: 2005-Feb-10

Publishing Venue

IBM

Related People

Authors:
Burbank, KE Capani, PM Greame, WH [+details]

Abstract

During precise four point probe resistance measurements of narrow circuit line segments of plated copper, it is essential that: 1. the on-center spacing of the voltage probes must be maintained throughout testing, and 2. the probe assembly must register in the same manner onto the subject line segment throughout testing from sample to sample.