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Detection of Surface Asperities on Film Substrates

IP.com Disclosure Number: IPCOM000050186D
Original Publication Date: 1982-Sep-01
Included in the Prior Art Database: 2005-Feb-10

Publishing Venue

IBM

Related People

Authors:
Bartkus, EA George, OE [+details]

Abstract

Asperities in biaxially oriented films produce a birefringent strain pattern which is detected by placing the film between crossed polarizing filters in a transmitted light beam. The height of the asperities is sensed by pressing the film against an optical flat glass surface with a reflected monochromatic light source. The number of the interference fringes is directly proportional to asperity height.