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Engineering Data Entry System for Automatic Generation of Array Test Programs

IP.com Disclosure Number: IPCOM000050308D
Original Publication Date: 1982-Oct-01
Included in the Prior Art Database: 2005-Feb-10

Publishing Venue

IBM

Related People

Authors:
Clark, LJ Deluca, GA Peters, RM Schnurmann, HD Vidunas, LJ [+details]

Abstract

This article describes a unique automated system which alleviates the difficulties caused by the current manual method of generating wafer test programs for array testers. An easy way to work with English language is introduced as part of a TSO (Time Sharing Option) data entry system. Bit patterns describing the various test functions to be performed on the array are generated automatically. The system acts to reduce dramatically the development cycle for creating wafer test programs for currently employed standard testers.